Event Profile
International Applied Reliability Symposium India 2010 is a distinctive event that is intended to offer an ideal forum for expert presenters from industry and government to collaborate with reliability practitioners from all across the world to discuss the application of reliability principles in order to deal with real world challenges. The event will be held under a particular theme "Sharing applications, success stories and lessons learned in reliability and maintainability engineering." This reliability and maintainability conference is organized five times a year at different places around the world. International Applied Reliability Symposium India - ARS 2010 will focus on many issues comprising: Reliability programs, Design for Reliability (DFR), Design for Six Sigma (DFSS), Reliability specifications and metrics, Data collection, Management and analysis, Experiment design and analysis, Accelerated testing, Failure Modes and Effects Analysis (FMEA), Reliability growth analysis, Software reliability, System analysis, Asset management and maintenance planning, Risk and safety analysis, and Warranty cost reduction.
Visitor Profile
The targeted visitors at International Applied Reliability Symposium India 2010 are: Reliability/maintainability engineers, Software engineers, Researchers, Academicians and Related professionals.
